Test Circuit for Vectorless Open Lead Detection of CMOS ICs
نویسندگان
چکیده
In this paper, a test circuit for a test method is proposed, with which open leads of CMOS logic ICs are detected without generating test input vectors. Open leads are detected by means of supply current of the test circuit that flows when an AC voltage signal is provided to targeted leads with test probes as a stimulus. It is examined by some experiments whether open leads will be detected with the test circuit. The empirical results show that open leads of CMOS ICs will be detected within 5μsec after attachment of test probes to targeted leads.
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تاریخ انتشار 2007